Developments in surface contamination and cleaning : fundamentals and applied aspects / edited by Rajiv Kohli and K. L. Mittal.
Series: Developments in Surface Contamination and Cleaning Series ; volume 1Publisher: Amsterdam : Elsevier, 2016Edition: Second editionDescription: Vol. 1(xxii,873 pages) : illustrations ; 23 cmContent type:- text
- unmediated
- volume
- 9780323299602
- 620.44 23 D489

Item type | Current library | Call number | Status | Notes | Date due | Barcode | |
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Central Library المكتبة المركزية | 620.44 D489 (Browse shelf(Opens below)) | Available | قاعة الكتب | 35470 | ||
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Central Library المكتبة المركزية | 620.44 D489 (Browse shelf(Opens below)) | Available | قاعة الكتب | 39929 |
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Includes bibliographical references and index.
The Physical Nature of Very, Very Small Particles and its Impact on their Behavior / Othmar Preining -- Transport and Deposition of Aerosol Particles / Daniel J. Rader and Anthony S. Geller -- Relevance of Particle Transport in Surface Deposition and Cleaning / Chao-Hsin Lin and Chao Zhu -- Aspects of Particle Adhesion and Removal / David J. Quesnel, Donald S. Rimai, David M. Schaefer, Stephen P. Beaudoin, Aaron Harrison, Darby Hoss, Melissa Sweat, and Myles Thomas -- Tribological Implication of Particles / Koji Kato -- ESD Controls in Cleanroom Environments : Relevance to Particle Deposition / Larry Levit and Arnold Steinman -- Airborne Molecular Contamination : Contamination on Substrates and the Environment in Semiconductors and Other Industries / Taketoshi Fujimoto, Kikuo Takeda, and Tatsuo Nonaka -- Surface Analysis Methods for Contaminant Identification / David A. Cole, Sachin Attavar, and Lei Zhang -- Electron Microscopy Techniques for Imaging and Analysis of Nanoparticles / Zhong Lin Wang and Jean L. Lee -- Wettability Techniques to Monitor the Cleanliness of Surfaces / Darren L. Williams and Kashmiri L. Mittal -- Cleaning with Solvents / John B. Durkee -- Removal of Particles by Chemical Cleaning / Philip G. Clark and Thomas J. Wagener -- The Use of Surfactants to Enhance Particle Removal from Surfaces / Michael L. Free -- Microabrasive Technology for Precision Cleaning and Processing / Rajiv Kohli -- Cleaning Using High-Speed Impinging Jet / Kuniaki Gotoh -- Carbon Dioxide Snow Cleaning / Robert Sherman -- Cleaning Using Argon/Nitrogen Cryogenic Aerosols / Wayne T. McDermott and Jeffery W. Butterbaugh -- Coatings for Prevention or Deactivation of Biological Contaminants / Joerg C. Tiller -- A Detailed Study of Semiconductor Wafer Drying / Wim Fyen, Frank Holsteyns, Twan Bearda, Sophia Arnauts, Jan Van Steenbergen, Geert Doumen, Karine Kenis, and Paul W. Mertens.