TY  - BOOK
AU  - Róz,Alessandra Luzia da
AU  - Ferreira,Marystela
AU  - Leite,Fábio de Lima
AU  - Oliveira,Osvaldo N.
TI  - Nanocharacterization techniques
T2  - Micro and nano technologies series
SN  - 9780323497787
AV  - TA418.9.N35 N326 2017
U1  - 620.5 23
PY  - 2017///
KW  - Nanostructured materials
N1  - Includes bibliographical references and index; Scanning electron microscopy / Marcelo de Assumpocao Pereira-da-Silva, FAbio A. Ferri -- Atomic force microscopy: a powerful tool for electrical characterization / Ronald Taram, Pamela S. Garcia, Daiana K. Deda, Jose A. Varela, Fabio de Lima Leite -- Spectroscopic techniques for characterization of nanomaterials / Priscila Alessio, Pedro H.B. Aoki, Leonardo N. Furini, Alvaro E. Aligag, Carlos J. Leopoldo Constantino -- Dynamic light scattering applied to nanoparticle characterization / Ana P. Ramos -- X-ray diffraction and scattering by nanomaterials / Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich -- Surface plasmon resonance (SPR) for sensors and biosensors / Celina M. Miyaszaki, Flavio M. Schimizu, Marystela Ferreira
N2  - This book covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail
ER  -