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Nanocharacterization techniques / edited by Alessandra L. Da Róz, Marystela Ferreira, Fabio de Lima Leite, Osvaldo N. Oliveira Jr.

Contributor(s): Series: Micro and nano technologies seriesCopyright date: ©2017Description: xi, 209 pages : illustrations, charts ; 24 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9780323497787
Subject(s): Additional physical formats: Ebook version :: No titleDDC classification:
  • 620.5 23 N187
LOC classification:
  • TA418.9.N35 N326 2017
Contents:
Scanning electron microscopy / Marcelo de Assumpocao Pereira-da-Silva, FAbio A. Ferri -- Atomic force microscopy: a powerful tool for electrical characterization / Ronald Taram, Pamela S. Garcia, Daiana K. Deda, Jose A. Varela, Fabio de Lima Leite -- Spectroscopic techniques for characterization of nanomaterials / Priscila Alessio, Pedro H.B. Aoki, Leonardo N. Furini, Alvaro E. Aligag, Carlos J. Leopoldo Constantino -- Dynamic light scattering applied to nanoparticle characterization / Ana P. Ramos -- X-ray diffraction and scattering by nanomaterials / Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich -- Surface plasmon resonance (SPR) for sensors and biosensors / Celina M. Miyaszaki, Flavio M. Schimizu, Marystela Ferreira.
Summary: This book covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail.
Item type: كتاب
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Item type Current library Call number Status Notes Date due Barcode
كتاب كتاب Central Library المكتبة المركزية 620.5 N187 (Browse shelf(Opens below)) Available قاعة الكتب

Includes bibliographical references and index.

Scanning electron microscopy / Marcelo de Assumpocao Pereira-da-Silva, FAbio A. Ferri -- Atomic force microscopy: a powerful tool for electrical characterization / Ronald Taram, Pamela S. Garcia, Daiana K. Deda, Jose A. Varela, Fabio de Lima Leite -- Spectroscopic techniques for characterization of nanomaterials / Priscila Alessio, Pedro H.B. Aoki, Leonardo N. Furini, Alvaro E. Aligag, Carlos J. Leopoldo Constantino -- Dynamic light scattering applied to nanoparticle characterization / Ana P. Ramos -- X-ray diffraction and scattering by nanomaterials / Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich -- Surface plasmon resonance (SPR) for sensors and biosensors / Celina M. Miyaszaki, Flavio M. Schimizu, Marystela Ferreira.

This book covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail.