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008 | 250907s2006 -us||||| |||| 00| 0 eng d | ||
010 | _a 92026807 | ||
015 |
_aGB9311379 _2bnb |
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020 | _a0306441578 | ||
020 | _a9780306441578 | ||
040 |
_aMaqsci73 _bara _cScip |
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050 | 0 | 0 |
_aTK7871.85 _b.L495 1993 |
082 | 7 | 4 |
_a621.3815/2 _220 _bSH546 |
084 |
_a33.72 _2bcl |
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084 |
_a53.55 _2bcl |
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084 |
_a53.51 _2bcl |
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084 |
_aUP 3050 _2rvk |
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084 |
_aELT 300f _2stub |
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084 |
_aPHY 685f _2stub |
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084 |
_aRL 55 _2blsrissc |
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100 | 1 |
_aLi, Sheng S., _d1938- |
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245 | 1 | 0 |
_aSemiconductor physical electronics / _cSheng S. Li. |
264 | 1 |
_aNew York : _bPlenum, _c�1993. |
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300 |
_axiii, 697 pages : _billustrations ; _c26 cm. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_aunmediated _bn _2rdamedia |
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338 |
_avolume _bnc _2rdacarrier |
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490 | 1 | _aMicrodevices | |
504 | _aIncludes bibliographical references and index. | ||
505 | 2 | _aCh. 1. Classification of Solids and Crystal Structure. 1.2. The Bravais Lattice. 1.3. The Crystal Structure. 1.4. Miller Indices and the Unit Cell. 1.5. The Reciprocal Lattice and Brillouin Zone. 1.6. Types of Crystal Bindings. 1.7. Defects in a Crystalline Solid -- Ch. 2. Lattice Dynamics. 2.2. The One-Dimensional Linear Chain. 2.3. Dispersion Relation for a Three-Dimensional Lattice. 2.4. Concept of Phonons. 2.5. The Density of States and Lattice Spectrum. 2.6. Lattice Specific Heat. 2.7. Elastic Constants and Velocity of Sound -- Ch. 3. Semiconductor Statistics. 3.2. Maxwell-Boltzmann (M-B) Statistics. 3.3. Fermi-Dirac (F-D) Statistics. 3.4. Bose-Einstein (B-E) Statistics. 3.5. Statistics in the Shallow-Impurity States -- Ch. 4. Energy Band Theory. 4.2. The Bloch-Floquet Theorem. 4.3. The Kronig-Penney Model. 4.4. The Nearly-Free Electron Approximation. 4.5. The Tight-Binding (LCAO) Approximation. 4.6. Energy Band Structures for Semiconductors. 4.7. The Effective Mass Concept. 4.8. Energy Band Structure and Density of States in a Superlattice -- Ch. 5. Equilibrium Properties of Semiconductors. 5.2. Densities of Electrons and Holes in a Semiconductor. 5.3. Intrinsic Semiconductors. 5.4. Extrinsic Semiconductors. 5.5. Ionization Energy of a Shallow Impurity Level. 5.6. Hall Effect, Hall Mobility, and Electrical Conductivity. 5.7. Heavy Doping Effects in a Degenerate Semiconductor -- Ch. 6. Excess Carrier Phenomenon in Semiconductors. | |
505 | 8 | _a6.2. Nonradiative Recombination: Shockley-Read-Hall Model. 6.3. Band-to-Band Radiative Recombination. 6.4. Band-to-Band Auger Recombination. 6.5. Basic Semiconductor Equations. 6.6. Charge-Neutrality Conditions. 6.7. The Haynes-Shockley Experiment. 6.8. Minority Carrier Lifetimes and Photoconductivity Experiment. 6.9. Surface States and Surface Recombination Velocity. 6.10. Deep-Level Transient Spectroscopy (DLTS) Technique. 6.11. Surface Photovoltage (SPV) Technique -- Ch. 7. Transport Properties of Semiconductors. 7.2. Galvanomagnetic, Thermoelectric, and Thermomagnetic Effects. 7.3. Boltzmann Transport Equation. 7.4. Derivation of Transport Coefficients. 7.5. Transport Coefficients for the Mixed Conduction Case. 7.6. Transport Coefficients for Some Semiconductors -- Ch. 8. Scattering Mechanisms and Carrier Mobilities in Semiconductors. 8.2. Differential Scattering Cross Section. 8.3. Ionized Impurity Scattering. 8.4. Neutral Impurity Scattering. 8.5. Acoustic Phonon Scattering. 8.6. Optical Phonon Scattering. 8.7. Scattering by Dislocations. 8.8. Electron and Hole Mobilities in Semiconductors. 8.9. Hot Electron Effects in a Semiconductor -- Ch. 9. Optical Properties and Photoelectric Effects. 9.1. Optical Constants of a Solid. 9.2. Free-Carrier Absorption Process. 9.3. Fundamental Absorption Process. 9.4. The Photoconductive Effect. 9.5. The Photovoltaic (Dember) Effect. 9.6. The Photomagnetoelectric Effect -- Ch. 10. Metal-Semiconductor Contacts. | |
505 | 8 | _a10.2. Metal Work Function and Schottky Effect. 10.3. Thermionic Emission Theory. 10.4. Ideal Schottky Barrier Contact. 10.5. Current Flow in a Schottky Barrier Diode. 10.6. I-V Characteristics of a Silicon and a GaAs Schottky Diode. 10.7. Determination of Barrier Height. 10.8. Enhancement of Effective Barrier Height. 10.9. Applications of Schottky Diodes. 10.10. Ohmic Contacts -- Ch. 11. p-n Junction Diodes. 11.2. Equilibrium Properties of a p-n Junction Diode. 11.3. p-n Junction Under Bias Conditions. 11.4. Minority Carrier Distribution and Current Flow. 11.5. Diffusion Capacitance and Conductance. 11.6. Minority Carrier Storage and Transient Behavior. 11.7. Zener and Avalanche Breakdowns. 11.8. Tunnel Diode. 11.9. p-n Heterojunction Diodes. 11.10. Junction Field-Effect Transistors -- Ch. 12. Photonic Devices. 12.2. Photovoltaic Devices. 12.3. Photodetectors. 12.4. Light-Emitting Diodes (LEDs). 12.5. Semiconductor Laser Diodes -- Ch. 13. Bipolar Junction Transistor. 13.2. Basic Structures and Modes of Operation. 13.3. Current-Voltage Characteristics. 13.4. Current Gain, Base Transport Factor, and Emitter Injection Efficiency. 13.5. Modeling of a Bipolar Junction Transistor. 13.6. Switching Transistor. 13.7. Advanced Bipolar Transistor. 13.8. Thyristors -- Ch. 14. Metal-Oxide-Semiconductor Field-Effect Transistors. 14.2. An Ideal Metal-Oxide-Semiconductor System. 14.3. Oxide Charges and Interface Traps. 14.4. The MOS Field-Effect Transistors. | |
505 | 8 | _a14.5. Charge-Coupled Devices -- Ch. 15. High-Speed III-V Semiconductor Devices. 15.2. Metal-Semiconductor Field-Effect Transistors. 15.3. Modulation-Doped Field-Effect Transistors (MODFETs). 15.4. Heterojunction Bipolar Transistor. 15.5. Hot Electron Transistors. 15.6. Resonant Tunneling Devices. 15.7. Transferred-Electron Devices. | |
650 | 0 | _aSemiconductors. | |
650 | 0 | _aSolid state physics. | |
650 | 2 | _aSemiconductors | |
650 | 6 | _aSemi-conducteurs. | |
650 | 6 | _aPhysique de l'�etat solide. | |
650 | 7 |
_asemiconductor. _2aat |
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650 | 7 |
_aSemiconductors. _2fast |
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650 | 7 |
_aSolid state physics. _2fast |
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650 | 7 |
_aFestk�orperphysik _2gnd |
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650 | 7 |
_aHalbleiter _2gnd |
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650 | 1 | 7 |
_aHalfgeleiders. _2gtt |
650 | 7 |
_aPhysique de l'�etat solide. _2ram |
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650 | 7 |
_aSemiconducteurs. _2ram |
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653 | 0 | _aSemiconductors | |
776 | 0 | 8 |
_iOnline version: _aLi, Sheng S., 1938- _tSemiconductor physical electronics. _dNew York : Plenum, �1993 _w(OCoLC)645858124 |
830 | 0 | _aMicrodevices. | |
856 | 4 | 1 |
_3Table of contents _uhttp://catdir.loc.gov/catdir/enhancements/fy1006/92026807-t.html |
856 | 4 | 1 |
_3Table of contents _uhttp://www.gbv.de/dms/bowker/toc/9780306441578.pdf |
856 | 4 | 1 |
_3Table of contents _uhttp://www.gbv.de/dms/ilmenau/toc/110350456.PDF |
856 | 4 | 2 |
_3Publisher description _uhttp://catdir.loc.gov/catdir/enhancements/fy1006/92026807-d.html |
910 | _aSHIREEN FALAH HASAN | ||
942 |
_2ddc _cBK |
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948 | _hNO HOLDINGS IN IQMCL - 216 OTHER HOLDINGS | ||
999 |
_c36043 _d36043 |